Fundamentals of atomic force microscopy,Part 1:Foundations
Material type: TextLanguage: English Series: Lessons from Nanoscience:Alecture note series. VOL:4 Publication details: New Jersey World Scientific 2016 Description: XV, 324p.pbkISBN: 9789814630351Subject(s): PHYSICS | MICROSCOPYDDC classification: 537.533.35Item type | Current library | Call number | Status | Date due | Barcode |
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Book | NISER LIBRARY | 537.533.35 REI-F (Browse shelf(Opens below)) | R (REFERENCE) | 16884 | |
Book | NISER LIBRARY | 537.533.35 REI-F (Browse shelf(Opens below)) | Available | 16885 |
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