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Fundamentals of atomic force microscopy,Part 1:Foundations

Reifenberger, Ronald G.

Fundamentals of atomic force microscopy,Part 1:Foundations - New Jersey World Scientific 2016 - XV, 324p.pbk. - Lessons from Nanoscience:Alecture note series VOL:4 .

ISBN: 9789814630351

Subjects--Topical Terms:
PHYSICS
MICROSCOPY

Dewey Class. No.: 537.533.35 / REI-F

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