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Fundamentals of atomic force microscopy,Part 1:Foundations (Record no. 25091)

MARC details
000 -LEADER
fixed length control field 00590cam a2200205 i 4500
005 - DATE & TIME
control field 20170202171802.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 141125m20169999njua b 001 0 eng
020 ## - ISBN
International Standard Book Number 9789814630351
040 ## - CATALOGING SOURCE
Original cataloging agency NISER LIBRARY
041 ## - Language
Language English
082 ## - UDC Number
Classification number 537.533.35
Book Number REI-F
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Reifenberger, Ronald G.
245 10 - TITLE STATEMENT
Title Fundamentals of atomic force microscopy,Part 1:Foundations
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc New Jersey
Name of publisher, distributor, etc World Scientific
Date of publication, distribution, etc 2016
300 ## - PHYSICAL DESCRIPTION
Pages XV, 324p.pbk.
440 ## - Series Statement
Series Title Lessons from Nanoscience:Alecture note series
Number VOL:4
650 #0 - Subject
Subject PHYSICS
650 #0 - Subject
Subject MICROSCOPY
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Book
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Location (home branch) Sublocation or collection (holding branch) Date acquired Koha issues (times borrowed) Koha full call number Barcode (Accession No.) Koha date last seen Price effective from Koha item type
    Universal Decimal Classification   R (REFERENCE) NISER LIBRARY NISER LIBRARY 02/02/2017   537.533.35 REI-F 16884 02/02/2017 02/02/2017 Book
    Universal Decimal Classification     NISER LIBRARY NISER LIBRARY 02/02/2017   537.533.35 REI-F 16885 02/02/2017 02/02/2017 Book
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