High-resolution x-ray scattering: from thin films to lateral nanostructures Ullrich Pietsch, Vaclav Holy and Tilo Baumbach
Material type: TextLanguage: English Publication details: NewYork Springer 2004 Edition: 2nd edDescription: xvi, 408pISBN: 9780387400921Subject(s): NANO STRUCTURE MATERIALS | THIN FILMS OPTICAL PROPERTIES | X-RAYS DIFFRACTION | X-RAYS SCATTERINGDDC classification: 539.216Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Book | NISER LIBRARY | 539.216 PIE-H (Browse shelf(Opens below)) | Available | 10364 | |
Book | NISER LIBRARY | 539.216 PIE-H (Browse shelf(Opens below)) | Available | 10365 |
There are no comments on this title.