High-resolution x-ray scattering: from thin films to lateral nanostructures Ullrich Pietsch, Vaclav Holy and Tilo Baumbach

By: Pietsch, UllrichContributor(s): Holy, Vaclav [Auth.]Material type: Text

TextLanguage: English Publication details: NewYork Springer 2004 Edition: 2nd edDescription: xvi, 408pISBN: 9780387400921Subject(s): NANO STRUCTURE MATERIALS | THIN FILMS OPTICAL PROPERTIES | X-RAYS DIFFRACTION | X-RAYS SCATTERINGDDC classification: 539.216

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Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	539.216 PIE-H (Browse shelf(Opens below))	Available		10364
Book	NISER LIBRARY	539.216 PIE-H (Browse shelf(Opens below))	Available		10365

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