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High-resolution x-ray scattering: from thin films to lateral nanostructures

Pietsch, Ullrich

High-resolution x-ray scattering: from thin films to lateral nanostructures Ullrich Pietsch, Vaclav Holy and Tilo Baumbach - 2nd ed. - NewYork Springer 2004 - xvi, 408p.

ISBN: 9780387400921

Subjects--Topical Terms:
NANO STRUCTURE MATERIALS
THIN FILMS OPTICAL PROPERTIES
X-RAYS DIFFRACTION
X-RAYS SCATTERING

Dewey Class. No.: 539.216 / PIE-H

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