Scanning probe microscopy = Electrical and electromechanical phenomena at the nanoscale vol.2 Sergei Kalinin and Alexei Gruverman

By: Kalinin, SContributor(s): Gruverman ,Alexei [Auth.]Material type: Text

TextLanguage: English Publication details: New work Springer 2007 Description: 980pISBN: 9780387286679Subject(s): KELVIN PROBE FORCE MICROSCOPY | SCANNING CAPACITANCE MICROSCOPYDDC classification: 543.456

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	543.456 KAL-S (Browse shelf(Opens below))	Available		4968

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Previous	543.442.3 JEN-I Introduction to x-ray powder diffractometry	543.4:537.635 KUP-M Magnetic resonance imaging:physical principles and application	543.456 BAR-S Scanning electrochemical microscopy	543.456 KAL-S Scanning probe microscopy = Electrical and electromechanical phenomena at the nanoscale vol.2	543.456 KAL-S Scanning probe microscopy=Electrical and electromechanical phenomena at the nanoscale (Vol1)	543.51 BAR-M Mass Spectrometry	543.51 COL-E Electrospray and maldi mass spectrometry: fundamentals,instrumentation, practicalities and biological applications	Next

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