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Scanning probe microscopy = Electrical and electromechanical phenomena at the nanoscale vol.2

Kalinin, S

Scanning probe microscopy = Electrical and electromechanical phenomena at the nanoscale vol.2 Sergei Kalinin and Alexei Gruverman - New work Springer 2007 - 980p.

Ref. sec

ISBN: 9780387286679

Subjects--Topical Terms:
KELVIN PROBE FORCE MICROSCOPY
SCANNING CAPACITANCE MICROSCOPY

Dewey Class. No.: 543.456 / KAL-S

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