Scanning probe microscopy = Electrical and electromechanical phenomena at the nanoscale vol.2 Sergei Kalinin and Alexei Gruverman
Material type: TextLanguage: English Publication details: New work Springer 2007 Description: 980pISBN: 9780387286679Subject(s): KELVIN PROBE FORCE MICROSCOPY | SCANNING CAPACITANCE MICROSCOPYDDC classification: 543.456Item type | Current library | Call number | Status | Date due | Barcode |
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Book | NISER LIBRARY | 543.456 KAL-S (Browse shelf(Opens below)) | Available | 4968 |
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