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	1.	High-resolution x-ray scattering: from thin films to lateral nanostructures Ullrich Pietsch, Vaclav Holy and Tilo Baumbach by Pietsch, Ullrich \| Holy, Vaclav [Auth.]. Edition: 2nd ed.Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: NewYork Springer 2004Availability: Items available for loan: NISER LIBRARY (2)Call number: 539.216 PIE-H, ... Place hold Log in to add tags Add to cart (remove)
	2.	Spectroscopic ellipsometry and reflectometry: a user's guide Harland G. Tompkins and William A. McGahan by Tompkins, HG \| McGahan, WA [Auth.]. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: New York Wiley 1999Availability: Items available for loan: NISER LIBRARY (1)Call number: 543.42 TOM-S. Place hold Log in to add tags Add to cart (remove)

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