Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching: application to rough and natural surfaces G Kaupp

By: Kaupp, GMaterial type: Text

TextLanguage: English Series: Nanoscience and nanotechnologyPublication details: Berlin Springer 2006 Description: 292pISBN: 9783540284055Subject(s): ATOMIC FORCE MICROSCOPY | NANOSCRATCHING | OPTICAL-MICROSCOPY | POLYMERSDDC classification: 620.3

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Holdings
Item type	Current library	Call number	Status	Barcode
Book	NISER LIBRARY	620.3 KAU-A (Browse shelf(Opens below))	R (REFERENCE)	8909
Book	NISER LIBRARY	620.3 KAU-A (Browse shelf(Opens below))	Available	8910
Book	NISER LIBRARY	620.3 KAU-A (Browse shelf(Opens below))	Available	8911

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