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Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching: application to rough and natural surfaces

Kaupp, G

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching: application to rough and natural surfaces G Kaupp - Berlin Springer 2006 - 292p. - Nanoscience and nanotechnology .

ISBN: 9783540284055

Subjects--Topical Terms:
ATOMIC FORCE MICROSCOPY
NANOSCRATCHING
OPTICAL-MICROSCOPY
POLYMERS

Dewey Class. No.: 620.3 / KAU-A

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