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	1.	Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James W. Mayer by Alford, TL \| Feldman, LC [Auth.]. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: New York Springer 2007Availability: Items available for loan: NISER LIBRARY (1)Call number: 620.3 ALF-F. Items available for reference: NISER LIBRARY: R (REFERENCE) (1)Call number: 620.3 ALF-F. Place hold Log in to add tags Add to cart (remove)
	2.	No cover image available No cover image available Thin films analysis by x-ray scattering Mario Birkholz by Birkhoz, Mario \| Fewster, Paul F [Auth.]. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Weinheim Wiley 2006Availability: Items available for loan: NISER LIBRARY (2)Call number: 539.216:535.34 BIR-T, ... Place hold Log in to add tags Add to cart (remove)

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