Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James W. Mayer
Material type: TextLanguage: English Publication details: New York Springer 2007 Description: xiv,336pISBN: 9780387292601Subject(s): FILM ANALYSIS | NANOSCALEDDC classification: 620.3Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Book | NISER LIBRARY | 620.3 ALF-F (Browse shelf(Opens below)) | Available | 21309 | |
Book | NISER LIBRARY | 620.3 ALF-F (Browse shelf(Opens below)) | R (REFERENCE) | 5848 |
Ref. sec
There are no comments on this title.