Optical Measurement of Surface Topography
Material type: Computer fileLanguage: English Publication details: Berlin, Heidelberg Springer Berlin Heidelberg 2011. ISBN: 9783642120121, 978-3-642-12012-1Subject(s): Microwaves, RF and Optical Engineering | Surfaces and Interfaces, Thin Films | Characterization and Evaluation of Materials | Materials Science | Measurement Science and Instrumentation | Microwaves | Surfaces (Physics)DDC classification: 620.11, Online resources: Click here to access onlineItem type | Current library | Call number | Status | Date due | Barcode |
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E(electronic)-Books | NISER LIBRARY | 620.11, 23 (Browse shelf(Opens below)) | Available | E7962 |
Chemistry and Materials Science (Springer-11644)
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