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Optical Measurement of Surface Topography

Optical Measurement of Surface Topography - Berlin, Heidelberg Springer Berlin Heidelberg 2011.

Chemistry and Materials Science (Springer-11644)

9783642120121, 978-3-642-12012-1


Microwaves, RF and Optical Engineering
Surfaces and Interfaces, Thin Films
Characterization and Evaluation of Materials
Materials Science
Measurement Science and Instrumentation
Microwaves
Surfaces (Physics)

620.11, / 23
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