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Optical Measurement of Surface Topography

Contributor(s): Leach, Richard., editorMaterial type:

Computer file

Computer fileLanguage: English Publication details: Berlin, Heidelberg Springer Berlin Heidelberg 2011. ISBN: 9783642120121, 978-3-642-12012-1Subject(s): Microwaves, RF and Optical Engineering | Surfaces and Interfaces, Thin Films | Characterization and Evaluation of Materials | Materials Science | Measurement Science and Instrumentation | Microwaves | Surfaces (Physics)DDC classification: 620.11, Online resources: Click here to access online

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Item type	Current library	Call number	Status	Date due	Barcode
E(electronic)-Books	NISER LIBRARY	620.11, 23 (Browse shelf(Opens below))	Available		E7962

Chemistry and Materials Science (Springer-11644)

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