Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) Ray E. Egerton
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Item type | Current library | Call number | Status | Date due | Barcode |
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19830 | |
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19831 | |
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19832 | |
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7766 | |
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7767 | |
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7768 |
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537.533.35 CAR-T Transmission electron microscopy: diffraction, imaging, and spectrometry | 537.533.35 COH-A Atomic force microscopy/scanning tunneling microscopy | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 FUL-T Transmission electron microscopy and diffractometry of materials | 537.533.35 FUL-T Transmission electron microscopy and diffractometry of materials |
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