Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) Ray E. Egerton
Material type: TextLanguage: English Publication details: New York Springer 2008 Description: xii, 202pISBN: 9780387258003Subject(s): ELECTRON MICROSCOPY | PHYSICAL PRINCIPLES | TEM SPECIMENSDDC classification: 537.533.35Item type | Current library | Call number | Status | Date due | Barcode |
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Book | NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19830 | |
Book | NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19831 | |
Book | NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19832 | |
Book | NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7766 | |
Book | NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7767 | |
Book | NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7768 |
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