Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) Ray E. Egerton
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
![]() |
NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19830 | |
![]() |
NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19831 | |
![]() |
NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19832 | |
![]() |
NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7766 | |
![]() |
NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7767 | |
![]() |
NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7768 |
Browsing NISER LIBRARY shelves Close shelf browser (Hides shelf browser)
537.533.35 COH-A Atomic force microscopy/scanning tunneling microscopy 3 | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 GOO-E Electron microscopy and analysis | 537.533.35 MEY-S Scanning probe microscopy: the lab on a tip | 537.533.35 MEY-S Scanning probe microscopy: the lab on a tip |
There are no comments on this title.