Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) Ray E. Egerton
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TextLanguage: English Publication details: New York Springer 2008 Description: xii, 202pISBN: 9780387258003Subject(s): ELECTRON MICROSCOPY | PHYSICAL PRINCIPLES | TEM SPECIMENSDDC classification: 537.533.35
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19830 | |
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19831 | |
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 19832 | |
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7766 | |
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Book
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7767 | |
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Book
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NISER LIBRARY | 537.533.35 EGE-P (Browse shelf(Opens below)) | Available | 7768 |
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| 537.533.35 COH-A Atomic force microscopy/sxcanning tunneling microscopy 2 | 537.533.35 COH-A Atomic force microscopy/scanning tunneling microscopy 3 | 537.533.35 COH-A Atomic force microscopy/scanning tunneling microscopy 3 | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 GOO-E Electron microscopy and analysis |
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