Introduction to scanning tunneling microscopy C. Julian Chen
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TextLanguage: English Series: monographs on the physics and chemistry of materials .64Publication details: New York OUP 2008 Edition: 2nd edDescription: lxiii, 423pISBN: 9780199211500Subject(s): ATOMIC FORCES | NANOMETER-SCALE IMAGINGDDC classification: 537.533.35
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NISER LIBRARY | 537.533.35 CHE-I (Browse shelf(Opens below)) | Available | 7594 | |
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Book
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NISER LIBRARY | 537.533.35 CHE-I (Browse shelf(Opens below)) | Available | 7595 | |
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Book
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NISER LIBRARY | 537.533.35 CHE-I (Browse shelf(Opens below)) | Available | 7596 |
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| 537.533.35 BOZ-E Electron microscopy:principles and techniques for biologists | 537.533.35 BOZ-E Electron microscopy:principles and techniques for biologists | 537.533.35 BOZ-E Cryo-preparation methods for electron microscopy | 537.533.35 CHE-I Introduction to scanning tunneling microscopy | 537.533.35 CHE-I Introduction to scanning tunneling microscopy | 537.533.35 CHE-I Introduction to scanning tunneling microscopy | 537.533.35 COH-A Atomic force microscopy/sxcanning tunneling microscopy 2 |
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