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Introduction to scanning tunneling microscopy

Chen, CJ

Introduction to scanning tunneling microscopy C. Julian Chen - 2nd ed. - New York OUP 2008 - lxiii, 423p. - monographs on the physics and chemistry of materials .64 .

ISBN: 9780199211500

Subjects--Topical Terms:
ATOMIC FORCES
NANOMETER-SCALE IMAGING

Dewey Class. No.: 537.533.35 / CHE-I

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