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Transmission electron microscopy : a textbook for materials science

By: Williams, David BContributor(s): Carter, C. BarryMaterial type: TextTextLanguage: English Publication details: New York: Springer; 2009. Edition: 2nd edDescription: xxxix, 760p. hbISBN: 9780387765006Subject(s): TRANSMISSION ELECTRON MICROSCOPE (TEM) | ELASTIC SCATTERING MECHANISM | BEAM DAMAGE | FIELD - EMISSION GUNS (FEGs) | PLASMA CLEANERSDDC classification: 55
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