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Transmission electron microscopy : a textbook for materials science

Williams, David B.

Transmission electron microscopy : a textbook for materials science - 2nd ed. - New York: Springer; 2009. - xxxix, 760p. hb.

ISBN: 9780387765006

Subjects--Topical Terms:
TRANSMISSION ELECTRON MICROSCOPE (TEM)
ELASTIC SCATTERING MECHANISM
BEAM DAMAGE
FIELD - EMISSION GUNS (FEGs)
PLASMA CLEANERS

Dewey Class. No.: 55 / WIL-T

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