Atomic force microscopy/scanning tunneling microscopy 3 edited by Samuel H. Cohen and Marcia L. Lightbody
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TextLanguage: English Publication details: New York plenum 1999 Description: 210pISBN: 9780306462979Subject(s): ATOMIC FORCE MICROSCOPOY | SCANNING TUNNELING MICROSCOPYDDC classification: 537.533.35
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Book
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NISER LIBRARY | 537.533.35 COH-A (Browse shelf(Opens below)) | R (REFERENCE) | 8986 |
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| 537.533.35 COH-A Atomic force microscopy/sxcanning tunneling microscopy 2 | 537.533.35 COH-A Atomic force microscopy/sxcanning tunneling microscopy 2 | 537.533.35 COH-A Atomic force microscopy/scanning tunneling microscopy 3 | 537.533.35 COH-A Atomic force microscopy/scanning tunneling microscopy 3 | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) |
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