Normal view MARC view ISBD view

Atomic force microscopy/scanning tunneling microscopy 3

Cohen, SH

Atomic force microscopy/scanning tunneling microscopy 3 edited by Samuel H. Cohen and Marcia L. Lightbody - New York plenum 1999 - 210p.

ISBN: 9780306462979

Subjects--Topical Terms:
ATOMIC FORCE MICROSCOPOY
SCANNING TUNNELING MICROSCOPY

Dewey Class. No.: 537.533.35 / COH-A

Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)