Scanning electron microscopy and x-ray microanalysis
Material type: TextLanguage: English Publication details: New York: Springer, 2018. Edition: 4th edDescription: xxiii, 550p. pb. 28cmISBN: 9781493982691Subject(s): ELECTRON MICROSCOPY | X-RAY | PHYSICS | MICROSCOPEDDC classification: 537.533.35Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Book | NISER LIBRARY | 537.533.35 GOL-S (Browse shelf(Opens below)) | Available | 23135 |
Browsing NISER LIBRARY shelves Close shelf browser (Hides shelf browser)
537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 FUL-T Transmission electron microscopy and diffractometry of materials | 537.533.35 FUL-T Transmission electron microscopy and diffractometry of materials | 537.533.35 GOL-S Scanning electron microscopy and x-ray microanalysis | 537.533.35 HAU-A Atomic force microscopy : understanding basic modes and advanced applications | 537.533.35 HAU-A Atomic force microscopy : understanding basic modes and advanced applications | 537.533.35 MOR-N Noncontact atomic force microscopy: vol.2 |
There are no comments on this title.