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Scanning electron microscopy and x-ray microanalysis

By: Goldstein, Joseph IContributor(s): Newbury, Dale E | Michael, JR | Ritchie, N.W.M | Scott, J.H.J | Joy, David CMaterial type: TextTextLanguage: English Publication details: New York: Springer, 2018. Edition: 4th edDescription: xxiii, 550p. pb. 28cmISBN: 9781493982691Subject(s): ELECTRON MICROSCOPY | X-RAY | PHYSICS | MICROSCOPEDDC classification: 537.533.35
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Item type Current library Call number Status Date due Barcode
Book Book NISER LIBRARY
537.533.35 GOL-S (Browse shelf(Opens below)) Available 23135

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