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In situ real time characterization of thin films

By: Edited by- Auciello, OrlandoContributor(s): Krauss, Alan RMaterial type: TextTextLanguage: English Publication details: New York Wiley 2001 Description: xi, 263pISBN: 9780471241416Subject(s): THIN FLIMSDDC classification: 539.216
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Item type Current library Call number Status Date due Barcode
Book Book NISER LIBRARY
539.216 AUC-I (Browse shelf(Opens below)) Available 21017

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