In situ real time characterization of thin films
Material type: TextLanguage: English Publication details: New York Wiley 2001 Description: xi, 263pISBN: 9780471241416Subject(s): THIN FLIMSDDC classification: 539.216Item type | Current library | Call number | Status | Date due | Barcode |
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Book | NISER LIBRARY | 539.216 AUC-I (Browse shelf(Opens below)) | Available | 21017 |
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