Normal view MARC view ISBD view

In situ real time characterization of thin films

Edited by- Auciello, Orlando

In situ real time characterization of thin films - New York Wiley 2001 - xi, 263p.

ISBN: 9780471241416

Subjects--Topical Terms:
THIN FLIMS

Dewey Class. No.: 539.216 / AUC-I

Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)