Electron microscopy and analysis PJ. Goodhew, J. Humphreys and R. Beanland
Material type: TextLanguage: English Publication details: London T & F 2001 Edition: 3rd edDescription: 251pISBN: 0748409688Subject(s): ELECTRON MICROSCOPYDDC classification: 537.533.35Item type | Current library | Call number | Status | Date due | Barcode |
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Book | NISER LIBRARY | 537.533.35 GOO-E (Browse shelf(Opens below)) | Available | 8197 |
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537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 GOO-E Electron microscopy and analysis | 537.533.35 MEY-S Scanning probe microscopy: the lab on a tip | 537.533.35 MEY-S Scanning probe microscopy: the lab on a tip | 537.533.35 MEY-S Scanning probe microscopy: the lab on a tip |
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