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Electron microscopy and analysis PJ. Goodhew, J. Humphreys and R. Beanland

By: Goodhew, PJContributor(s): Humphreys, J [Auth.]Material type: TextTextLanguage: English Publication details: London T & F 2001 Edition: 3rd edDescription: 251pISBN: 0748409688Subject(s): ELECTRON MICROSCOPYDDC classification: 537.533.35
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Item type Current library Call number Status Date due Barcode
Book Book NISER LIBRARY
537.533.35 GOO-E (Browse shelf(Opens below)) Available 8197

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