Scanning probe microscopy: the lab on a tip
Material type: TextLanguage: English Publication details: Berlin Springer 2004 Description: x, 210p. hbISBN: 9783540431800Subject(s): PHYSICS | FORCE MICROSCOPY | SCANNING MICROSCOPYDDC classification: 537.533.35Item type | Current library | Call number | Status | Date due | Barcode |
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Book | NISER LIBRARY | 537.533.35 MEY-S (Browse shelf(Opens below)) | R (REFERENCE) | 8917 | |
Book | NISER LIBRARY | 537.533.35 MEY-S (Browse shelf(Opens below)) | Available | 8918 | |
Book | NISER LIBRARY | 537.533.35 MEY-S (Browse shelf(Opens below)) | Available | 8919 | |
Book | NISER LIBRARY | 537.533.35 MEY-S (Browse shelf(Opens below)) | Available | 8920 |
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537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 GOO-E Electron microscopy and analysis | 537.533.35 MEY-S Scanning probe microscopy: the lab on a tip | 537.533.35 MEY-S Scanning probe microscopy: the lab on a tip | 537.533.35 MEY-S Scanning probe microscopy: the lab on a tip | 537.533.35 MEY-S Scanning probe microscopy: the lab on a tip |
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