Normal view MARC view ISBD view

Scanning probe microscopy: the lab on a tip

Meyer, E

Scanning probe microscopy: the lab on a tip - Berlin Springer 2004 - x, 210p. hb.

ISBN: 9783540431800

Subjects--Topical Terms:
PHYSICS
FORCE MICROSCOPY
SCANNING MICROSCOPY

Dewey Class. No.: 537.533.35 / MEY-S

Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)