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Atomic force microscopy : understanding basic modes and advanced applications

By: Haugstad, GregMaterial type: TextTextLanguage: English Publication details: New Jersey Wiley 2012 Description: xxii, 464 p. pbkISBN: 9780470638828Subject(s): PHYSICS | ATOMIC FORCE MICROSCOPYDDC classification: 537.533.35
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Item type Current library Call number Status Date due Barcode
Book Book NISER LIBRARY
537.533.35 HAU-A (Browse shelf(Opens below)) Available 16942
Book Book NISER LIBRARY
537.533.35 HAU-A (Browse shelf(Opens below)) R (REFERENCE) 16775

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