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Atomic force microscopy : understanding basic modes and advanced applications

Haugstad, Greg

Atomic force microscopy : understanding basic modes and advanced applications - New Jersey Wiley 2012 - xxii, 464 p. pbk.

ISBN: 9780470638828

Subjects--Topical Terms:
PHYSICS
ATOMIC FORCE MICROSCOPY

Dewey Class. No.: 537.533.35 / HAU-A

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