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Scanning probe microscopy=Electrical and electromechanical phenomena at the nanoscale (Vol1) Sergei Kalinin and Alexei Gruverman

By: Kalinin, SContributor(s): Gruverman, Alexei [Auth.]Material type: TextTextLanguage: English Publication details: New Work Springer 2007 Description: xx, 558pISBN: 9780387286679Subject(s): MICROSCOPY | MULTI-PROBE SCANNING | NEAR-FIELD HIGH-FREQUENCY PROBINGDDC classification: 543.456
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