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Scanning probe microscopy=Electrical and electromechanical phenomena at the nanoscale (Vol1)

Kalinin, S

Scanning probe microscopy=Electrical and electromechanical phenomena at the nanoscale (Vol1) Sergei Kalinin and Alexei Gruverman - New Work Springer 2007 - xx, 558p.

ISBN: 9780387286679

Subjects--Topical Terms:
MICROSCOPY
MULTI-PROBE SCANNING
NEAR-FIELD HIGH-FREQUENCY PROBING

Dewey Class. No.: 543.456 / KAL-S

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