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Transmission Electron Microscopy and Diffractometry of Materials

Contributor(s): Fultz, Brent., authorMaterial type:

Computer file

Computer fileLanguage: English Publication details: Berlin, Heidelberg Springer Berlin Heidelberg 2008. Edition: Third EditionISBN: 9783540738862, 978-3-540-73886-2Subject(s): Surfaces and Interfaces, Thin Films | Characterization and Evaluation of Materials | Chemistry | Chemistry | Crystallography | Crystallography | Particles (Nuclear physics) | Physics and Applied Physics in Engineering | Solid State Physics and Spectroscopy | Surfaces (Physics)Online resources: Click here to access online

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Item type	Current library	Call number	Status	Date due	Barcode
E(electronic)-Books	NISER LIBRARY		Available		E7796

Chemistry and Materials Science (Springer-11644)

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