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Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials - Third Edition. - Berlin, Heidelberg Springer Berlin Heidelberg 2008.

Chemistry and Materials Science (Springer-11644)

ISBN: 9783540738862, 978-3-540-73886-2

Subjects--Topical Terms:
Surfaces and Interfaces, Thin Films
Characterization and Evaluation of Materials
Chemistry
Chemistry
Crystallography
Crystallography
Particles (Nuclear physics)
Physics and Applied Physics in Engineering
Solid State Physics and Spectroscopy
Surfaces (Physics)

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