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Scanning Microscopy for Nanotechnology

Contributor(s): Zhou, Weilie., editorMaterial type: Computer fileComputer fileLanguage: English Publication details: New York, NY Springer New York 2007. ISBN: 9780387396200, 978-0-387-39620-0Subject(s): Characterization and Evaluation of Materials | Chemistry | Chemistry | Measurement Science and Instrumentation | Nanotechnology | Nanotechnology | Optical and Electronic Materials | Optical materials | Surfaces (Physics)DDC classification: 620.115, Online resources: Click here to access online
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Item type Current library Call number Status Date due Barcode
E(electronic)-Books E(electronic)-Books NISER LIBRARY
620.115, 23 (Browse shelf(Opens below)) Available E7262

Chemistry and Materials Science (Springer-11644)

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