Scanning Microscopy for Nanotechnology
Material type: Computer fileLanguage: English Publication details: New York, NY Springer New York 2007. ISBN: 9780387396200, 978-0-387-39620-0Subject(s): Characterization and Evaluation of Materials | Chemistry | Chemistry | Measurement Science and Instrumentation | Nanotechnology | Nanotechnology | Optical and Electronic Materials | Optical materials | Surfaces (Physics)DDC classification: 620.115, Online resources: Click here to access onlineItem type | Current library | Call number | Status | Date due | Barcode |
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E(electronic)-Books | NISER LIBRARY | 620.115, 23 (Browse shelf(Opens below)) | Available | E7262 |
Chemistry and Materials Science (Springer-11644)
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