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Scanning Microscopy for Nanotechnology

Scanning Microscopy for Nanotechnology - New York, NY Springer New York 2007.

Chemistry and Materials Science (Springer-11644)

ISBN: 9780387396200, 978-0-387-39620-0

Subjects--Topical Terms:
Characterization and Evaluation of Materials
Chemistry
Chemistry
Measurement Science and Instrumentation
Nanotechnology
Nanotechnology
Optical and Electronic Materials
Optical materials
Surfaces (Physics)

Dewey Class. No.: 620.115, / 23

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