Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Material type: Computer fileLanguage: English Publication details: Dordrecht Springer Netherlands 2005. ISBN: 9781402030192, 978-1-4020-3019-2Subject(s): Surfaces and Interfaces, Thin Films | Condensed matter | Condensed Matter | Nanotechnology | Nanotechnology | Optical and Electronic Materials | Optical materials | Physics | Physics | Surfaces (Physics)DDC classification: 530.41, Online resources: Click here to access onlineItem type | Current library | Call number | Status | Date due | Barcode |
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E(electronic)-Books | NISER LIBRARY | 530.41, 23 (Browse shelf(Opens below)) | Available | E2987 |
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Physics and Astronomy (Springer-11651)
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