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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - Dordrecht Springer Netherlands 2005.

Physics and Astronomy (Springer-11651)

ISBN: 9781402030192, 978-1-4020-3019-2

Subjects--Topical Terms:
Surfaces and Interfaces, Thin Films
Condensed matter
Condensed Matter
Nanotechnology
Nanotechnology
Optical and Electronic Materials
Optical materials
Physics
Physics
Surfaces (Physics)

Dewey Class. No.: 530.41, / 23

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