000			02311 a2200313 4500
003			NISER
005			20260309161741.0
008			260309b |||||||| |||| 00| 0 hin d
020			_a9781493982493 _qPaperback
040			_aNISER LIBRARY _beng _cNISER LIBRARY
082	0	4	_a537.533.35 _bZUO-A
100	1		_aZuo, Jian Min
245	1	0	_aAdvanced transmission electron microscopy : _bimaging and diffraction in nanoscience
260			_aNew York, NY : _bSpringer, _c2017.
300			_axxvi, 729 pages : _billustrations (92 b/w illustrations, 218 illustrations in colour) ; _c24 cm.
504			_aIncludes bibliographical references and index.
520			_aThis volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.
650		0	_aTransmission electron microscopy
650		0	_aElectron diffraction geometry
650		0	_aElectron diffraction theory
650		0	_aUltrafast electron diffraction
650		0	_aMaterials science
650		0	_aNanochemistry
650		0	_aPhotonics
700	1		_aSpence, John C.H.
856	4	1	_3Table of contents _uhttps://link.springer.com/content/pdf/bfm:978-1-4939-6607-3/1
856	4	1	_3Reviews _uhttps://www.goodreads.com/book/show/42589417-advanced-transmission-electron-microscopy?ref=nav_sb_ss_1_13#CommunityReviews
942			_cBK _2udc
999			_c36802 _d36802