000 | 00666nam a2200229Ia 4500 | ||
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008 | 140908s9999 xx 000 0 und d | ||
020 | _a9780471181729 | ||
040 | _aNISER LIBRARY | ||
041 | _aEnglish | ||
082 |
_a543.42 _bTOM-S |
||
100 | _aTompkins, HG | ||
245 |
_aSpectroscopic ellipsometry and reflectometry: a user's guide _cHarland G. Tompkins and William A. McGahan |
||
260 |
_aNew York _bWiley _c1999 |
||
300 | _axiv,328p. | ||
500 | _aRef. sec | ||
650 | _aELLIPSOMETRY | ||
650 | _aMATERIALS-OPTICAL PROPERTIES | ||
650 | _aREFLECTOMETRY | ||
650 | _aTHIN FILMS-OPTICAL PROPERTIES | ||
700 |
_aMcGahan, WA _4Auth. |
||
942 | _cBK | ||
999 |
_c3571 _d3571 |