| 000 | 00877nam a22002897a 4500 | ||
|---|---|---|---|
| 005 | 20240508145017.0 | ||
| 008 | 230223b |||||||| |||| 00| 0 hin d | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a535 _bSIK-D |
||
| 100 | _aSikdar, Mrinal kanti | ||
| 245 | _aDefect engineering in ZnO nanostructures for optoelectronic applications | ||
| 260 |
_aBhubaneswar: _bNISER, _c2023 |
||
| 300 | _axxi, 112p. | ||
| 650 | _aX-RAY DIFFRACTION | ||
| 650 | _aDENSITY FUNCTIONAL THEORY (DFT) | ||
| 650 | _aNON LINEAR OPTICAL | ||
| 650 | _aCHEMICAL VAPOUR DEPOSITION (CVD) | ||
| 650 | _aWHISPERING - GALLERY MODE (WGB) | ||
| 650 | _aOPTICAL STUDIES | ||
| 650 | _aSEED LAYER | ||
| 650 | _aION IMPLANTATION | ||
| 650 | _aX - RAY ABSORPTION SPECTROSCOPY (SXAS) | ||
| 650 | _aTOTAL ELECTRON YIELD (TEY) | ||
| 700 | _aSahoo, Pratap kumar | ||
| 942 | _cTHPHD | ||
| 999 |
_c33818 _d33818 |
||