| 000 | 00727nam a22002537a 4500 | ||
|---|---|---|---|
| 005 | 20230406160100.0 | ||
| 008 | 221119b ||||| |||| 00| 0 hin d | ||
| 020 | _a9780387765006 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a55 _bWIL-T |
||
| 100 | _aWilliams, David B. | ||
| 245 |
_aTransmission electron microscopy _b: a textbook for materials science |
||
| 250 | _a2nd ed. | ||
| 260 |
_aNew York: _bSpringer; _c2009. |
||
| 300 |
_axxxix, 760p. _bhb. |
||
| 650 | _aTRANSMISSION ELECTRON MICROSCOPE (TEM) | ||
| 650 | _aELASTIC SCATTERING MECHANISM | ||
| 650 | _aBEAM DAMAGE | ||
| 650 | _aFIELD - EMISSION GUNS (FEGs) | ||
| 650 | _aPLASMA CLEANERS | ||
| 700 | _aCarter, C. Barry | ||
| 942 | _cBK | ||
| 999 |
_c33650 _d33650 |
||