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040			_aNISER LIBRARY _cNISER LIBRARY
041			_aEnglish
082			_a55 _bREE-E
100			_aReed, S. J. B.
245			_aElectron microprobe analysis and scanning electron microscopy in geology
250			_a2nd ed.
260			_aCambridge: _bCambridge University Press, _c2005
300			_axiii,189 p. _bPbk.
504			_aTable of Contents Preface Acknowledgements 1. Introduction 2. Electron-specimen interactions 3. Instrumentation 4. Scanning electron microscopy 5. X-ray spectrometers 6. Element mapping 7. X-ray analysis (1) 8. X-ray analysis (2) 9. Sample preparation Appendix References Index.
520			_aOriginally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
650			_aPetrofabric analysis
650			_aElectron probe microanalysis
650			_aScanning electron microscopy
942			_cBK _2udc
999			_c32926 _d32926